In the year 2026 the EN 12543 was moved to ISO 32543 and the different parts are thinned out.
In ISO 32543-1, the pin hole method permits the measurement of focal spot shape and focal spot sizes ≥ 100 μm. This is former EN 12543-2 and similar to ASTM E1165/26.
The edge measurement method of ISO 32543-2 uses the edge method with hole or disk type test objects and is intended as a user method for measurement of effective focal spot sizes of nano-, micro-, mini- and macro- (standard) focus tubes; the new method is similar to the annex of ASTM E1165/26.
ISO 32543-3 covers the measurement of the effective focal spot size of mini- and microfocus X-ray tubes from 5 μm to 300 μm. This is former EN 12543-5 and similar to ASTM E2903.

Two further methods are in preparation as a part of the ISO 32543 series:
ISO 32543-4 line pair test objects for measuring the effective focal spot size of micro- and nanofocus X-ray tubes with focal spot sizes ranging from 0.2 μm to 100 μm. This method is intended for use by manufacturers and users. The NxS test object should replace the JIMA resolution chart, which does not fit at higher energies.
ISO 32543-5 reconstruction of the spot shape from hole test object measurements. The image of ISO 32543-2 or a hole image of ISO 32543-4 may be used with a CT reconstruction algorithm to get an image similar to the pin hole method - if the SNR is very high and if no phase contrast is observed.
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