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PostPosted: 05.11.2019, 21:14 
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New Compensation Principles for enhanced image quality in industrial radiology with Digital Detector Arrays

U. Ewert, U. Zscherpel, BAM, Berlin, Germany; K. Bavendiek, YXLON International GmbH, Hamburg, Germany; Jason Robbins, YXLON International Inc., Akron, OH, USA; Cliff Bueno, GE Global Research Center, Niskayuna, NY, USA; Debasish Mishra, GE Global Research, Bangalore, India; Trey Gordon, Boeing Research and Technology, Seattle, WA, USA;

Materials Evaluation, February 2010, Volume 68, Number 2, Pages 163 - 168


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